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Technoorg Linda Broad Beam Ion Mill


Microscopy and Microanalysis Facility

  • Manufacturer: Technoorg Linda
  • Model: SEMPrep2
  • Year: 2018
  • Building: 301
  • Room: 015

For final polishing of flat sample surfaces to remove the physical damage that mechanical polishing can introduce. Ideal for EBSD samples where a damage-free surface is critical. Can also cross-section small samples (no greater than 3 mm in width).

  • Circular stage; one sample at a time
  • Maximum sample dimensions possible: 30 mm diameter and 10 mm height
  • Two ion guns: low energy: 0.1-2 kV and high energy: 4-16 kV
  • Semi-automated process

Contact: MMF