EVO SEM

Microscopy and Microanalysis Facility

• Manufacturer: Zeiss
• Model: Evo 40XVP
• Year: 2008
• Building: 301
• Room: 020

The EVO is a variable pressure scanning electron microscope (VP-SEM). The microscope is suitable for general purpose microstructural analysis at high vacuum, or for the analysis of non-conductive/hydrated samples at lower vacuum.

• SE imaging
• BSE imaging
• Basic CL imaging
• X-Ray point analysis and mapping
• Variable pressure possible for moist, uncoated samples
• EBSD

Contact: Zakaria Quadir