Skip to main content

Neon Dual-Beam FESEM

Neon Dual-Beam FESEM

Microscopy and Microanalysis Facility

  • Manufacturer: Zeiss
  • Model: Neon 40EsB
  • Year: 2008
  • Building: 301
  • Room: 020B

The Neon is a dual-beam field emission scanning electron microscope (FESEM). This instrument combines extremely high resolution imaging with regular energy dispersive x-ray spectrometry (EDS) and electron backscattered diffraction (EBSD).

  • High resolution SE imaging, BSE imaging
  • EDS point analysis and mapping
  • EBSD mapping

Contact: MMF