Neon Dual-Beam FESEM
![Neon Dual-Beam FESEM](https://jdlc.curtin.edu.au/wp-content/uploads/sites/39/2018/04/FIBSEM-1-320x200.jpg)
Microscopy and Microanalysis Facility
- Manufacturer: Zeiss
- Model: Neon 40EsB
- Year: 2008
- Building: 301
- Room: 020B
The Neon is a dual-beam field emission scanning electron microscope (FESEM). This instrument combines extremely high resolution imaging with regular energy dispersive x-ray spectrometry (EDS) and electron backscattered diffraction (EBSD).
- High resolution SE imaging, BSE imaging
- EDS point analysis and mapping
- EBSD mapping
Contact: MMF