Neon Dual-Beam FESEM
Microscopy and Microanalysis Facility
- Manufacturer: Zeiss
- Model: Neon 40EsB
- Year: 2008
- Building: 301
- Room: 020B
The Neon is a dual-beam field emission scanning electron microscope (FESEM). This instrument combines high resolution imaging with energy dispersive x-ray spectrometry (EDS) and electron backscattered diffraction (EBSD).
- High resolution SE and BSE imaging.
- EDS point analysis and mapping.
- EBSD mapping.