SHRIMP II B

Sensitive High Resolution Ion Micro Probe Facility

• Manufacturer: A.S.I
• Model: II
• Year: 2006
• Building: 301
• Room: 046

In situ U-Th-Pb geochronology of minerals.

• High Mass Resolution
• High Abundance Sensitivity
• 5 um Spatial Resolution
• Polarity Reversible
• Trace element measurements
• Depth Profiling