Neon Dual-Beam FESEM

Microscopy and Microanalysis Facility

• Manufacturer: Zeiss
• Model: Neon 40EsB
• Year: 2008
• Building: 301
• Room: 020B

The Neon is a dual-beam field emission scanning electron microscope (FESEM). This instrument combines extremely high resolution imaging with regular energy dispersive x-ray spectrometry (EDS) and electron backscattered diffraction (EBSD).

• High resolution SE imaging, BSE imaging
• EDS point analysis and mapping
• EBSD mapping

Contact: MMF