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X-Ray Photoelectron Spectroscopy System

X-Ray Photoelectron Spectroscopy System

X-Ray Surface Analysis Facility

  • Manufacturer: Kratos
  • Model: AXIS Ultra DLD
  • Year: 2013
  • Building: 301
  • Room: 043

Uses x-ray photoemission in ultra-high vacuum to determine the elemental and chemical composition of the surface of samples. Sensitive to the first 2-5 nanometres of the sample.

  • High intensity monochromated x-ray source (Al or Ag).
  • Imaging analyser with magnetic immersion lens for high sensitivity.
  • Cluster or monoatomic argon ion source for surface cleaning and depth profiling.
  • Charge neutralisation for working with insulating samples.
  • Helium UV lamp for valence band spectroscopy.
  • Preferred sample size: Less than 15mm in diameter and less than 2mm thick. Powders acceptable.