Skip to main content

SHRIMP II A

SHRIMP II A

Sensitive High Resolution Ion Micro Probe Facility

  • Manufacturer: A.S.I
  • Model: II
  • Year: 1992
  • Building: 301
  • Room: 042

In situ U-Th-Pb geochronology of minerals.

  • High Mass Resolution
  • High Abundance Sensitivity
  • 5 um Spatial Resolution
  • Polarity Reversible
  • Trace element measurements
  • Depth Profiling

Contact: Allen Kennedy